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Nr. Titel Autor Jahr
1 Investigation of the IGBT’s and Diode’s Ruggedness Under Short-Circuit Type III Conditions Well Beyond the SOA Mysore, Madhu Lakshman* et al. 2023
2 Study of Different Parameters Influencing the IGBT and Diode Robustness Under Short-Circuit Type III Conditions Mysore, Madhu Lakshman* et al. 2023
3 Surge-Current capability of the different voltage class IGBTs Mysore, Madhu Lakshman et al. 2023
4 Investigation of the Short Circuit Type II Safe Operating Area of IGBTs Mysore, Madhu Lakshman et al. 2022
5 Aluminium modification as indicator for current filaments under repetitive short-circuit in 650 V IGBTs Mysore, Madhu Lakshman et al. 2021
6 Study of 6.5 kV injection enhanced floating emitter (IEFE) IGBT switching behavior and its improved short-circuit robustness Mysore, Madhu Lakshman et al. 2021
7 Current filament behavior in IGBTs of different voltage classes investigated by measurements and simulations Bhojani, Riteshkumar et al. 2020
8 TRANSISTORBAUELEMENT MIT HOHER STROMFESTIGKEIT Bhojani, Riteshkumar et al. 2020
9 Al modification as indicator of current filaments in IGBTs under repetitive SC operation Mysore, Madhu Lakshman et al. 2019
10 Investigation of repetitive short-circuit operation of 1200 V IGBTs in the IC-VCEphase space Bhojani, Riteshkumar* et al. 2019
11 Transistor device with high current robustness Bhojani, Riteshkumar et al. 2019
12 Local Aluminium Modification as Indicator for Current Filaments in IGBTs far beyond the Safe Operating Area Bhojani, Riteshkumar et al. 2018
13 Observation of Current Filaments in IGBTs with Thermoreflectance Microscopy Bhojani, Riteshkumar et al. 2018
14 Transistor Device with High Current Robustness Bhojani, Riteshkumar et al. 2018
15 Transistorbauelement mit hoher Stromfestigkeit Bhojani, Riteshkumar et al. 2018
16 Unified view on energy and electrical failure of the short-circuit operation of IGBTs Baburske, Roman* et al. 2018
17 A Novel Injection Enhanced Floating Emitter (IEFE) IGBT structure Improving the Ruggedness Against Short-Circuit and Thermal Destruction Bhojani, Riteshkumar et al. 2017
18 Simulation study on collector side filament formation at short-circuit in IGBTs Bhojani, Riteshkumar et al. 2016
19 Untersuchung von tiefen Störstellen in SiC-Schottky-Dioden mit frequenzabhängiger Admittanzspektroskopie Pertermann, Eric et al. 2015
20 Detection of Deep Energy Levels in Semiconductors Using Frequency-Resolved Impedance Spectroscopy Pertermann, Eric et al. 2014
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