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Nr. Titel Autor Jahr
1 Current filament behavior in IGBTs of different voltage classes investigated by measurements and simulations Bhojani, Riteshkumar et al. 2020
2 Influence of repetitive short circuit events on the power cycling capability of IGBTs in a molded package Schwabe, Christian* et al. 2020
3 Influence of the gate resistance on the short circuit type II & III behavior of IGBT modules and protection Liu, Xing* et al. 2020
4 The Influence of the gate driver and common source inductance on the short circuit behavior of IGBT modules and protection Liu, Xing* et al. 2020
5 A Clamping Circuit for Short Circuit Ruggedness Improvement of Discrete IGBT Devices based on the di/dt Feedback of Emitter Stray Inductance Liu, Xing et al. 2019
6 Al modification as indicator of current filaments in IGBTs under repetitive SC operation Mysore, Madhu Lakshman et al. 2019
7 Investigation of repetitive short-circuit operation of 1200 V IGBTs in the IC-VCEphase space Bhojani, Riteshkumar* et al. 2019
8 Investigation of the avalanche ruggedness of SiC MPS diodes under repetitive unclamped-inductive-switching stress Palanisamy, Shanmuganathan* et al. 2019
9 Short Circuit Robustness of an Aged High Power IGBT-Module Bäumler, Christian* et al. 2019
10 Structure and Switching Behavior Optimization of fast 4.5 kVPress-Pack Diodes Zhi, Zheng* et al. 2019
11 Temperature determination of SiC MPS diodes during surge current event with measurement and simulation Palanisamy, Shanmuganathan* et al. 2019
12 Investigation on the interaction between surge current pulse and power cycling test Li, Zheming et al. 2018
13 Local Aluminium Modification as Indicator for Current Filaments in IGBTs far beyond the Safe Operating Area Bhojani, Riteshkumar et al. 2018
14 Observation of Current Filaments in IGBTs with Thermoreflectance Microscopy Bhojani, Riteshkumar et al. 2018
15 Repetitive surge current test of SiC MPS diode with load in bipolar regime Palanisamy, Shanmuganathan et al. 2018
16 Unified view on energy and electrical failure of the short-circuit operation of IGBTs Baburske, Roman* et al. 2018
17 Device for temporarily carrying current of energy transmission or distribution equipment according to the needs Geske, Martin et al. 2017
18 GATESPANNUNGSÜBERSTEUERUNG FÜR DAS SCHALTEN VON STOSSSTRÖMEN IN IGBT SCHALTERN Geske, Martin et al. 2017
19 Analyse chipnaher Verbindungen mittels thermisch sensibler elektrischer Parameter Herold, Christian et al. 2015
20 Gallium arsenide semiconductor parameters extracted from pin diode measurements and simulations Bhojani, Riteshkumar et al. 2015
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Anzahl der Dokumente: 26

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