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Nr. Titel Autor Jahr
1 Correlation of band gap position with composition in high-k films Ding, Li et al. 2014
2 Interface properties of OFETs based on an air-stable n-channel perylene tetracarboxylic diimide semiconductor Lüttich, Franziska et al. 2012
3 Dielectric Function of Ultra-Thin High-k Films Grown by Atomic Layer Ding, Li et al. 2011
4 Indium tin oxide on copper phthalocyanine - an ellipsometry study Friedrich, Marion et al. 2010
5 Optical Characterisation of BiFeO3 Epitaxial Thin Films Grown by Pulsed-Laser Deposition Himcinschi, Cameliu et al. 2010
6 Optical Investigation of CuPc Thin Films on Vicinal Si(111) Ding, Li et al. 2010
7 The Morphology and Optical Properties of CuPc Thin Films on Passivated Si(111) Ding, Li et al. 2009
8 VUV Ellipsometry of BiFeO3 Thin Films Grown by Pulsed-Laser Deposition Himcinschi, Cameliu et al. 2009
9 Spectroscopic Ellipsometry Study of Thin Diffusion Barriers of TaN and Ta for Cu Interconnects in Integrated Circuits Rudra, Sukumar et al. 2008
10 Thermal and photo-induced phase transformations ofSilver(I)-2-[2-(2-methoxyethoxy)-ethoxy]acetat Jakob, Alexander et al. 2008
11 Scaling Down Thickness of ULK Materials for 65nm Node and its Effect on Electrical Performance Frühauf, Swantje* et al. 2005
12 Spectroscopic Ellipsometry and Reflectance Anisotropy Spectroscopy of Biomolecular Layers on Silicon Surfaces Zahn, Dietrich R. T. et al. 2005
13 IR Reflection of Optical Phonons in GaN/AlGaN Superlattices Milekhin, Alexander G. et al. 2004
14 Infrared Spectroscopic Study of the Morphology of 3,4,9,10-Perylene Tetracarboxylic Dianhydride Films Grown on H-Passivated Si(111) Scholz, Reinhard et al. 2003
15 Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements Salvan, Georgeta et al. 2001
16 Infrared Study of the Si Surfaces and Bonded Si Wafers Milekhin, Alexander G. et al. 1999
17 Sulfide Passivation of GaAs: The Role of the Sulfur Chemical Activity Bessolov, Vasily N. et al. 1998
18 Optical properties of nitrogen-rich carbon films deposited by d.c. magnetron sputtering Friedrich, Marion et al. 1997
19 RAMAN Spectroscopy Investigation of Cubic Boron Nitride Single Crystals and Layers on Si (100) Werninghaus, Thomas et al. 1997
20 Utilization of the Cathodic Arc Evaporation for the Deposition of Boron Nitride Thin Films Richter, Frank et al. 1997
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