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Nr. Titel Autor Jahr
1 In situ Spectroscopic Ellipsometry Monitoring of Alq3 and 𝛼-NPD Alkali Metal Doping Haidu, Francisc et al. 2013
2 Substrate Influence on the Optical and Structural Properties of Pulsed Laser Deposited BiFeO3 Epitaxial Films Himcinschi, C. et al. 2010
3 Adsorption of small organic ring molecules on GaAs(001) c(4x4) - Structural and electronic properties Bruhn, T. et al. 2008
4 Reduced intermolecular interaction in organic ultra-thin films of α-NPD: A multi-sample analysis using VUV ellipsometry Rudra, S. et al. 2008
5 Spectroscopic Ellipsometry Study of Thin Diffusion Barriers of TaN and Ta for Cu Interconnects in Integrated Circuits Rudra, Sukumar et al. 2008
6 Spectroscopic ellipsometry study of thin diffusion barriers of TaN and Ta for Cu interconnects in integrated circuits Rudra, Sukumar* et al. 2008
7 Investigation of the Dielectric Function of Guanine and Cytosine Heterostructures Louis, S.J. et al. 2007
8 IR - Synchrotron Mapping Ellipsometry for Characterisation of Biomolecular Films Hinrichs, K. et al. 2007
9 The Bonding Configuration of Cyclopentene and 1,4-Cyclohexadiene on GaAs(001) Surfaces Paßmann, R. et al. 2007
10 IR - Synchrotron Ellipsometry for the Characterisation of Nanostructured Organic and Biomolecular Films: DNA Bases and Polymer Brushes Hinrichs, K. et al. 2006
11 Molecular Interactions in Organic Ultra Thin Films Studied by VUV Spectroscopic Ellipsometry Gordan, Ovidiu-Dorin et al. 2006
12 Reduced Intermolecular Interaction in Organic Ultrathin Films Gordan, Ovidiu-Dorin* et al. 2006
13 Dielectric Functions of DNA Base Films from Near-Infrared to Ultra-Violet Silaghi, S. D. et al. 2005
14 Ellipsometry from Infrared to Vacuum Ultraviolet: Structural Properties of Thin Anisotropic Guanine Films on Silicon Hinrichs, K.* et al. 2005
15 Stability of tris(8-hydroxyquinoline)-Aluminium(III) Films Investigated by Vacuum Ultraviolet Spectroscopic Ellipsometry Himcinschi, C. et al. 2005
16 Sub-Monolayer Sensitivity in VUV Ellipsometry Investigations of Organic Thin Films Gordan, Ovidiu-Dorin et al. 2005
17 Vacuum Ultraviolet Spectroscopic Ellipsometry Investigations of Guanine Layers on H-Passivated Si(1 1 1) Surfaces Silaghi, S. D.* et al. 2004
18 VUV-Spectroscopic Ellipsometry Investigations of DNA Base Layers Grown onto Flat H-Passivated Silicon Surfaces Silaghi, S. D. et al. 2004
19 VUV-SE Spectra of Guanine Layers on H-Si(111) Surfaces Silaghi, S. D. et al. 2003
20 Raman Monitoring of Semiconductor Growth Wagner, V. et al. 1994
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