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Nr. Titel Autor Jahr
1 Surface chemistry models for low temperature Si epitaxy process simulation in a single-wafer reactor Jäckel, Linda* et al. 2024
2 Automatic Detection of Via Arrays in AFM Images for CMP Dishing Evaluation Zienert, Andreas* et al. 2023
3 Modeling a Wet Wafer Surface Processing Chain Huber, Max* et al. 2023
4 Modeling the temporal evolution and stability of thin evaporating films for wafer surface processing Huber, Max et al. 2023
5 Multi-scale simulation of epitaxial processes Jäckel, Linda* et al. 2023
6 A Hybrid Chemical Mechanical Planarization (CMP) Model for Time-Dependent, Spatial Material Removal Rate Optimization Rothe, Tom* et al. 2022
7 Automatic Analysis of CMP Dishing in Via Arrays from AFM Images Langer, Jan* et al. 2022
8 Modeling the temporal evolution and stability of thin evaporating films for wafer surface processing Huber, Max* et al. 2022
9 Optimization of synthetic jet actuation by analytical modeling Huber, Max et al. 2021
10 An improved Green’s function algorithm applied to quantum transport in carbon nanotubes Teichert, Fabian* et al. 2019
11 Computationally efficient simulation method for conductivity modeling of 2D-based conductors Rizzi, Leo* et al. 2019
12 Electrical Conductivity Modeling of Graphene-based Conductor Materials Rizzi, Leo* et al. 2018
13 Electronic transport through defective semiconducting carbon nanotubes Teichert, Fabian* et al. 2018
14 Feasible Device Architectures for Ultrascaled CNTFETs Pacheco-Sanchez, Anibal et al. 2018
15 Modeling of current-voltage characteristics of BFO based memristors Huber, Max et al. 2018
16 Pulse Current Electrochemical Deposition of Copper for Through Silicon Vias in MEMS: Experiment and Simulation Hofmann, Lutz et al. 2018
17 Characterization and optimization of devices for active flow control Huber, Max et al. 2017
18 DFTB-based recursive Green’s function algorithms for electron transport in quasi-1D systems Teichert, Fabian et al. 2017
19 Electronic transport in metallic carbon nanotubes with mixed defects within the strong localization regime Teichert, Fabian* et al. 2017
20 Elektrochemische Pulsstromabscheidung von Kupfer für Si-Durchkontakte in MEMS: Experiment und Simulation Hofmann, Lutz et al. 2017
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Anzahl der Dokumente: 53

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