Universitätsbibliothek
Universitätsbibliographie

Universitätsbibliographie | Universitätsbibliothek | TU Chemnitz

Universitätsbibliothek

Ergebnis der Datenbankabfrage

Nr.	Titel	Autor	Jahr
1	Impact of Package Degradation on Short-Circuit Robustness and Temperature Stability during Application-Close Repetitive Switching of IGBTs	Bäumler, Christian	2026
2	On the Reverse Recovery of SiC MOSFET Inverse Diodes	Lutz, Josef* et al.	2026
3	Impact of IGBT emitter pad design and front-side aging on switching stability and temperature distribution	Bäumler, Christian* et al.	2025
4	Investigation on the Short-Circuit Behavior of HV-SiC-MOSFETs in Quasi Series Connection	Gesele, Felix et al.	2025
5	Short-Circuit Behavior of Quasi Series Connected SiC-MOSFETs:Measurements and Simulative Validation	Bäumler, Christian* et al.	2025
6	Understanding Snap-Off Phenomenon during Reverse Recovery in SiC MOSFET Body Diodes	Maitra, Abhishek* et al.	2025
7	Semiconductor Package or a Printed Circuit Board, Both Modified to One or More of Reduce, Inverse or Utilize Magnetic Coupling Caused by the Load Current of a Semiconductor Transistor	Liu, Xing et al.	2024
8	Understanding Inter-Chip Oscillations in Paralleled SiC MOSFETs	Maitra, Abhishek* et al.	2024
9	Impact of Degradation Mechanisms in Gate Stress Tests on the Hard-Switching Behavior of 1.2 kV SiC Power MOSFETs	Boldyrjew-Mast, Roman* et al.	2022
10	Influence of Magnetic Coupling Effects between Load and GateCommutation Loop on the Short Circuit Behavior	Bäumler, Christian* et al.	2022
11	Temperature Distribution of an IGBT Chip during Repetitive SwitchingEvents under Consideration of Front-Side Ageing	Bäumler, Christian et al.	2022
12	Influence of Power Cycling Aging to IGBT Hard Switching Behavior	Liu, Xing* et al.	2021
13	Reliability aspects of 3D integrated power devices	Bäumler, Christian* et al.	2021
14	Influence of repetitive short circuit events on the power cycling capability of IGBTs in a molded package	Schwabe, Christian* et al.	2020
15	The Influence of the gate driver and common source inductance on the short circuit behavior of IGBT modules and protection	Liu, Xing* et al.	2020
16	Advanced Temperature Estimation in Low Rds,on p-GaN HEMT Devices for Performing Power Cycling Tests	Franke, Jörg* et al.	2019
17	Short Circuit Robustness of an Aged High Power IGBT-Module	Bäumler, Christian* et al.	2019

Aktuelle Seite:
Anzahl der Ergebnisseiten:	1
Anzahl der Dokumente:	17