Ergebnis der Datenbankabfrage
| Nr. | Titel | Autor | Jahr |
|---|---|---|---|
| 1 | Influence of repetitive short circuit events on the power cycling capability of IGBTs in a molded package | Schwabe, Christian* et al. | 2020 |
| 2 | The Influence of the gate driver and common source inductance on the short circuit behavior of IGBT modules and protection | Liu, Xing* et al. | 2020 |
| 3 | Advanced Temperature Estimation in Low Rds,on p-GaN HEMT Devices for Performing Power Cycling Tests | Franke, Jörg* et al. | 2019 |
| 4 | Short Circuit Robustness of an Aged High Power IGBT-Module | Bäumler, Christian* et al. | 2019 |
| Anzahl der Ergebnisseiten: | 1 |
| Anzahl der Dokumente: | 4 |
