Eintrag in der Universitätsbibliographie der TU Chemnitz
Hu, Zhining ; Schlosser, Tobias ; Friedrich, Michael ; Vieira e Silva, Andre Luiz ; Beuth, Frederik ; Kowerko, Danny
Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects
| Universität: | Technische Universität Chemnitz | |
| Institut: | Juniorprofessur Media Computing | |
| Dokumentart: | Konferenzbeitrag, referiert | |
| ISBN/ISSN: | Electronic ISBN: 979-8-3503-6123-0 ; Print on Demand(PoD) ISBN: 979-8-3503-6124-7 ; Electronic ISSN: 1946-0759 ; Print on Demand(PoD) ISSN: 1946-0740 | |
| DOI: | doi:10.1109/etfa61755.2024.10710793 | |
| URL/URN: | https://ieeexplore.ieee.org/document/10710793/ | |
| Quelle: | 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA), 10.-13.09.2024 Padua Italien https://2024.ieee-etfa.org/. - IEEE, 2024 | |
| Freie Schlagwörter (Englisch): | Computer Vision , Convolutional Neural Networks , Data Synthesis , Deep Learning , Generative Adversarial Networks , Pattern Recognition , Visual Inspection , Wafer , Wafer Dicing |
