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Nr.	Titel	Autor	Jahr
1	Simulation of semiconductor wafer dicing induced faults on chips and their application as augmentation method for a deep learning based visual inspection system	Friedrich, Michael et al.	2025
2	Hexagonal Image Processing for Computer Vision With Hexnet: A Hexagonal Image Processing Data Set and Generator	Schlosser, Tobias* et al.	2024
3	Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects	Hu, Zhining et al.	2024
4	A Consolidated Overview of Evaluation and Performance Metrics for Machine Learning and Computer Vision	Schlosser, Tobias* et al.	2023
5	Biologically Inspired Hexagonal Deep Learning for Hexagonal Image Processing With The Hexagonal Image Processing Framework Hexnet	Schlosser, Tobias et al.	2023
6	Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks	Schlosser, Tobias et al.	2022
7	Improving Automated Visual Fault Detection by Combining a Biologically Plausible Model of Visual Attention with Deep Learning	Beuth, Frederik et al.	2021
8	Fehlerdetektion und -klassifikation bei Laserschneidprozessen mittels Deep Neural Networks	Schlosser, Tobias et al.	2020
9	Hexagonale Bildverarbeitung im Kontext maschineller Lernverfahren: Konzeption eines biologisch inspirierten hexagonalen Deep Learning Frameworks	Schlosser, Tobias et al.	2020
10	Improving Automated Visual Fault Detection by Combining a Biologically Plausible Model of Visual Attention with Deep Learning	Beuth, Frederik* et al.	2020
11	A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks	Schlosser, Tobias et al.	2019
12	Hexagonal Image Processing in the Context of Machine Learning: Conception of a Biologically Inspired Hexagonal Deep Learning Framework	Schlosser, Tobias et al.	2019

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