Universitätsbibliothek
Universitätsbibliographie

Universitätsbibliographie | Universitätsbibliothek | TU Chemnitz

Ergebnis der Datenbankabfrage

Nr.	Titel	Autor	Jahr
1	Adapted Temperature Calibration for Schottky p-GaN Power HEMTs	Goller, Maximilian et al.	2023
2	Comparison of IGBT Junction Temperature Determination using an On-Chip Sensor and the VCE(T) Method	Lakshmanan, Narender* et al.	2023
3	Reliability Investigations on 650 V Schottky p-GaN Power Gallium Nitride HEMTs	Goller, Maximilian et al.	2023
4	Zuverlässigkeit von AlGaN/GaN-Leistungsbauelementen	Franke, Jörg	2022
5	Power Cycling Results of Discrete Gallium Nitride Gate Injection Transistors	Goller, Maximilian* et al.	2021
6	Reliability aspects of 3D integrated power devices	Bäumler, Christian* et al.	2021
7	Investigation of the current collapse behaviour in GaN power HEMTs with highly adjustable pulse and measurement concept	Goller, Maximilian* et al.	2020
8	Advanced Temperature Estimation in Low Rds,on p-GaN HEMT Devices for Performing Power Cycling Tests	Franke, Jörg* et al.	2019
9	Reliability test results of PCB soldered GaN GIT devices	Boldyrjew-Mast, Roman* et al.	2019
10	Investigation of thermal conditions in power modules for traction application depending on the delamination of the system solder	Schwabe, Christian et al.	2018
11	Power cycling reliability results of GaN HEMT devices	Franke, Jörg* et al.	2018
12	Reliability and reliability investigation of wide-bandgap power devices	Lutz, Josef* et al.	2018
13	Determination of State-of-Health and Remaining Lifetime of Power Modules	Franke, Jörg* et al.	2017
14	Internal processes in power semiconductors at virtual junction temperature measurement	Chen, Weinan* et al.	2016
15	Requirements in power cycling for precise lifetime estimation	Herold, Christian* et al.	2016
16	Analyse chipnaher Verbindungen mittels thermisch sensibler elektrischer Parameter	Herold, Christian et al.	2015
17	Methods for virtual junction temperature measurement respecting internal semiconductor processes	Herold, Christian et al.	2015
18	GaN Virtual Prototyping: from traps modeling to system-level cascode optimization	Curatola, Gilberto et al.	2014
19	On-line temperature measurement of SiC-BJTs using Vbe thermal sensitive electrical parameters	Frankeser, Sophia et al.	2014

Aktuelle Seite:
Anzahl der Ergebnisseiten:	1
Anzahl der Dokumente:	19