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Nr.	Titel	Autor	Jahr
1	Substrate Influence on the Optical and Structural Properties of Pulsed Laser Deposited BiFeO₃ Epitaxial Films	Himcinschi, C. et al.	2010
2	Reduced intermolecular interaction in organic ultra-thin films of α-NPD: A multi-sample analysis using VUV ellipsometry	Rudra, S. et al.	2008
3	Spectroscopic Ellipsometry Study of Thin Diffusion Barriers of TaN and Ta for Cu Interconnects in Integrated Circuits	Rudra, Sukumar et al.	2008
4	Spectroscopic ellipsometry study of thin diffusion barriers of TaN and Ta for Cu interconnects in integrated circuits	Rudra, Sukumar* et al.	2008
5	Investigation of the Dielectric Function of Guanine and Cytosine Heterostructures	Louis, S.J. et al.	2007
6	Molecular Interactions in Organic Ultra Thin Films Studied by VUV Spectroscopic Ellipsometry	Gordan, Ovidiu-Dorin et al.	2006
7	Reduced Intermolecular Interaction in Organic Ultrathin Films	Gordan, Ovidiu-Dorin* et al.	2006
8	Dielectric Functions of DNA Base Films from Near-Infrared to Ultra-Violet	Silaghi, S. D. et al.	2005
9	Ellipsometry from Infrared to Vacuum Ultraviolet: Structural Properties of Thin Anisotropic Guanine Films on Silicon	Hinrichs, K.* et al.	2005
10	Stability of tris(8-hydroxyquinoline)-Aluminium(III) Films Investigated by Vacuum Ultraviolet Spectroscopic Ellipsometry	Himcinschi, C. et al.	2005
11	Sub-Monolayer Sensitivity in VUV Ellipsometry Investigations of Organic Thin Films	Gordan, Ovidiu-Dorin et al.	2005
12	Vacuum Ultraviolet Spectroscopic Ellipsometry Investigations of Guanine Layers on H-Passivated Si(1 1 1) Surfaces	Silaghi, S. D.* et al.	2004
13	VUV-Spectroscopic Ellipsometry Investigations of DNA Base Layers Grown onto Flat H-Passivated Silicon Surfaces	Silaghi, S. D. et al.	2004
14	VUV-SE Spectra of Guanine Layers on H-Si(111) Surfaces	Silaghi, S. D. et al.	2003

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