Eintrag in der Universitätsbibliographie der TU Chemnitz
Albrecht, Jan ; Horn, Tobias Daniel ; Hertenstein, Leonhard ; Rzepka, Sven
Physics-of-Failure based Lifetime Prediction for Power Electronics under Mission Profile Load Conditions
| Universität: | Technische Universität Chemnitz | |
| Institut: | Zentrum für Mikrotechnologien (ZfM) | |
| Dokumentart: | Konferenzbeitrag, referiert | |
| ISBN/ISSN: | Electronic ISBN: 979-8-3503-9300-2 ; Print on Demand(PoD) ISBN: 979-8-3503-9301-9 ; Electronic ISSN: 2833-8596 ; Print on Demand(PoD) ISSN: 2833-8553 | |
| DOI: | doi:10.1109/EuroSimE65125.2025.11006588 | |
| URL/URN: | https://www.scopus.com/pages/publications/105007442345?origin=resultslist | |
| Quelle: | 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2025, 2025 April 6-9, Utrecht (Netherlands). - IEEE, 2025 | |
| Freie Schlagwörter (Englisch): | Analytical models , Computational modeling , Thermomechanical processes , Multichip modules , Predictive models , Power electronics , Data models , Transient analysis , Stress , Load modeling |
