Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | Determining adhesion of critical interfaces in microelectronics – A reverse Finite Element Modelling approach based on nanoindentation | Reuther, G. M.* et al. | 2022 |
2 | Parametrically Generated FE Models for the Design for Reliability of Classical and Embedded Power Modules | Kolas, Kshitij et al. | 2022 |
3 | Reliability Modelling for Different Wire Bonding Technologies based on FEA and Nano-Indentation | Dudek, Rainer* et al. | 2020 |
4 | Reliability of IoT Sensor Systems: New Methods for the Efficient and Comprehensive Reliability Assessment | Albrecht, Jan* et al. | 2019 |
5 | Religion in the making: the Lived Ancient Religion approach | Degelmann, Christopher et al. | 2018 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 5 |