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Nr. Titel Autor Jahr
1 Advanced power cycling test strategies on discrete SiC MOSFETs in different operating modes and the impact on lifetime Hein, Lukas* et al. 2025
2 Factors Influencing the Power Cycling Lifetime of Paralleled IGBT Chips Abuogo, James et al. 2025
3 Influence of Low Temperature Swings and Short Heating Times on the Power Cycling Capability of IGBTs in Discrete Housings Heimler, Patrick* et al. 2025
4 Influence of Switching Loss Magnitude on Lifetime During a Switch-Mode Power Cycling Test of SiC MOSFETs Abuogo, James* et al. 2025
5 Influencing Factors on the Dynamic VSD Behaviour of different SiC-MOSFET Technologies used for Temperature Read-Out via VSD(T)-Method during the Power Cycling Test Heimler, Patrick* et al. 2025
6 Influencing Parameters on the Dynamic On-State Resistance RDS,on in GaN HEMTs and its Recovery Behavior Goller, Maximilian* et al. 2025
7 Investigation of Overcurrent Turn-Off Robustness of 1200 V SiC MOSFETs Mysore, Madhu Lakshman* et al. 2025
8 Investigation on the High Temperature Behaviour of p-GaN HEMTs by Different Temperature Sensitive Electrical Parameters Hein, Lukas* et al. 2025
9 Neue Möglichkeiten zum Kampf gegen Krebs – Aber blamables Gutachterwesen Bittel, Günther et al. 2025
10 Power Cycling Reliability of Paralleled IGBT Chips Heated with Conduction and Switching Losses Abuogo, James* et al. 2025
11 Reliability of discrete SiC MOSFETs under severe temperature-shock and power cycling tests Heimler, Patrick* et al. 2025
12 Reliability Testing of SiC MOSFETs in Different Power Cycling Operating Modes - Focusing on the Challenges of Body Diode Testing Hein, Lukas* et al. 2025
13 Surge Current Operation of Power GaN HEMTs with p-GaN Gate Under Positive Gate Voltage Goller, Maximilian* et al. 2025
14 The impact of mold compound on power cycling capability of SiC MOSFETs in double sided cooled modules Lentzsch, Tobias* et al. 2025
15 Threshold voltage hysteresis investigation of SiC MOSFETs with different structures under various measurement conditions Xie, Dong* et al. 2025
16 Understanding Snap-Off Phenomenon during Reverse Recovery in SiC MOSFET Body Diodes Maitra, Abhishek* et al. 2025
17 Utilization of the IGBT On-Chip Temperature Sensor for Online Temperature Monitoring Considering Continuous Switching Operation Lakshmanan, Narender et al. 2025
18 An Improved Approach for an Intermediate Measurement Routine of Dynamic On-State Resistance for GaN Power Devices Goller, Maximilian et al. 2024
19 Determination of the Junction Temperature Under Load Current in GaN Power Devices with Schottky Gate Leakage Current as TSEP Goller, Maximilian et al. 2024
20 Fatigue Crack Networks in Die-Attach Layers of IGBT Modules Under a Power Cycling Test Liu, Shenyi* et al. 2024
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