Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | Avalanche Robustness of SiC MOSFETs in Parallel Connections | Herrmann, Clemens et al. | 2023 |
2 | The Impact of the Dead-Time on the Reverse Recovery Behavior of SiC-MOSFET Body Diodes | Liu, Xing* et al. | 2023 |
3 | Ouvercurrent turn-off robustness and stability of switching behaviour of SiC MOSFET body diodes | Palanisamy, Shanmuganathan et al. | 2022 |
4 | Fast Short Circuit Type I Detection Method based on VGE-Monitoring | Herrmann, Clemens* et al. | 2021 |
5 | Influence of Lateral Temperature Gradients on the Failure Modes at Power Cycling | Liu, Xing et al. | 2021 |
6 | Influence of the gate resistance on the short circuit type II & III behavior of IGBT modules and protection | Liu, Xing* et al. | 2020 |
7 | The Influence of the gate driver and common source inductance on the short circuit behavior of IGBT modules and protection | Liu, Xing* et al. | 2020 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 7 |