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Nr.	Titel	Autor	Jahr
1	Influence of the Gate Switching Instability Induced Threshold Voltage Drift on the Hard Switching Behavior of 1.2 kV SiC MOSFETs	Boldyrjew-Mast, Roman* et al.	2025
2	3rd Quadrant Surge Current SOA of SiC MOSFETs with Different Voltage Class	Alaluss, Mohamed* et al.	2024
3	An Accelerated Dynamic Gate Switching Stress Test Concept for SiC MOSFETs at High Drain Drain-Source Voltage (HV-GSS)	Herrmann, Clemens* et al.	2024
4	Energy Balancing in Paralleled SiC MOSFETs During an Avalanche Event	Herrmann, Clemens* et al.	2024
5	Gate Switching Instability of SiC MOSFETs under Simultaneously High Drain-Source Voltage and High Frequency Acceleration	Thiele, Sven* et al.	2024
6	Avalanche Robustness of SiC MOSFETs in Parallel Connections	Herrmann, Clemens et al.	2023
7	The Impact of the Dead-Time on the Reverse Recovery Behavior of SiC-MOSFET Body Diodes	Liu, Xing* et al.	2023
8	Ouvercurrent turn-off robustness and stability of switching behaviour of SiC MOSFET body diodes	Palanisamy, Shanmuganathan et al.	2022
9	Fast Short Circuit Type I Detection Method based on VGE-Monitoring	Herrmann, Clemens* et al.	2021
10	Influence of Lateral Temperature Gradients on the Failure Modes at Power Cycling	Liu, Xing et al.	2021
11	Influence of the gate resistance on the short circuit type II & III behavior of IGBT modules and protection	Liu, Xing* et al.	2020
12	The Influence of the gate driver and common source inductance on the short circuit behavior of IGBT modules and protection	Liu, Xing* et al.	2020