Ergebnis der Datenbankabfrage

Nr.	Titel	Autor	Jahr
1	Untersuchung von tiefen Störstellen in SiC-Schottky-Dioden mit frequenzabhängiger Admittanzspektroskopie	Pertermann, Eric et al.	2015
2	Detection of Deep Energy Levels in Semiconductors Using Frequency-Resolved Impedance Spectroscopy	Pertermann, Eric et al.	2014
3	Optimization of the Selenium Field-Stop Profile with Respect to Softness and Robustness	Pertermann, Eric et al.	2014
4	Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept	Basler, Thomas et al.	2014
5	Measurements and Simulations of the Turn-Off Behaviour of Diodes with Deep Energy Levels of Se implanted in Si	Pertermann, Eric et al.	2013
6	The Effect of Selenium Deep Energy Levels in Si on the Turn-Off Behaviour of Diodes	Pertermann, Eric et al.	2012
7	Silizium- und SiC-Leistungsdioden unter besonderer Berücksichtigung von elektrisch-thermischen Kopplungseffekten und nichtlinearer Dynamik	Felsl, Hans Peter (Diplom-Physiker)	2009
8	Analysis of a p+p-n-n+ diode structure	Chen, Min et al.	2008
9	Ruggedness Analysis of 3.3kV High Voltage Diodes considering various Buffer Structures and Edge Terminations	Heinze, Birk et al.	2008
10	The CIBH Diode : Great Improvement for Ruggedness and Softness of High Voltage Diodes	Felsl, Hans Peter et al.	2008
11	A diode structure with anode side buried p doped layers for damping of dynamic avalanche	Chen, Min et al.	2007
12	Ruggedness of high voltage diodes under very hard Commutation Conditons	Heinze, Birk et al.	2007