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Nr.	Titel	Autor	Jahr
1	Avalanche ruggedness and failure mode of SiC trench MOSFETs	Tuncay, Sebnem* et al.	2023
2	Validity of power cycling lifetime models for modules and extension to low temperature swings	Lutz, Josef* et al.	2020
3	Experimental investigation of linear cumulative damage theory with power cycling test	Zeng, Guang et al.	2019
4	Power cycling results of high power IGBT modules close to 50 Hz heating process	Zeng, Guang et al.	2019
5	Some aspects in lifetime prediction of power semiconductor devices	Zeng, Guang	2019
6	Temperature determination of SiC MPS diodes during surge current event with measurement and simulation	Palanisamy, Shanmuganathan* et al.	2019
7	Difference in device temperature determination using pn-junction forward voltage and gate threshold voltage	Zeng, Guang et al.	2018
8	Experimental investigation of linear cumulative damage theory with power cycling test	Zeng, Guang et al.	2018
9	First results of development of a lifetime model for transfer molded discrete power devices	Zeng, Guang et al.	2018
10	Investigation on the interaction between surge current pulse and power cycling test	Li, Zheming et al.	2018
11	Power cycling reliability results of GaN HEMT devices	Franke, Jörg* et al.	2018
12	Study on power cycling test with different control strategies	Zeng, Guang* et al.	2018
13	Power cycling capability of high power IGBT modules with focus on short load pulse duration	Zeng, Guang et al.	2017
14	Thermal calculation methodology for lifetime estimation of semiconductor devices in MMC application	Ye, Yijun et al.	2017
15	High-Current Power Cycling Test-Bench for Short Load Pulse Duration and First Results	Zeng, Guang et al.	2016
16	Multi-Terminal HVDC Modeling in Power Flow Analysis Considering Converter Station Topologies and Losses	Zeng, Guang et al.	2015

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Anzahl der Ergebnisseiten:	1
Anzahl der Dokumente:	16