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Nr. Titel Autor Jahr
1 Probing interlayer excitons in a vertical van der Waals p-n junction using scanning probe microscopy technique Rahaman, Mahfujur* et al. 2019
2 Influence of defect-induced deformations on electron transport in carbon nanotubes Teichert, Fabian et al. 2018
3 Influence of defect-induced deformations on electron transport in carbon nanotubes Teichert, Fabian* et al. 2018
4 Ab initio calculations and strain-dependent scaling of excitons in carbon nanotubes Wagner, Christian et al. 2017
5 Mechanical, Electronic and Optical Properties of Strained Carbon Nanotubes Wagner, Christian Friedemann 2017
6 Modellierung axial verspannter CNT-Transistoren für Sensoren Wagner, Christian et al. 2017
7 Ab initio calculation of optical spectra of strained carbon nanotubes Wagner, Christian* et al. 2016
8 Ab initio study of the trimethylaluminum atomic layer deposition process on carbon nanotubes—An alternative initial step Förster, Anja et al. 2016
9 Electronic structure calculations for carbon nanotubes under strain Wagner, Christian et al. 2016
10 Empirical transport model of strained {CNT} transistors used for sensor applications Wagner, Christian* et al. 2016
11 Mechanical and vibrational properties of strained carbon nano-materials Croy, Alexander et al. 2016
12 Optical spectra of strained carbon nanotubes: Ab initio predictions Wagner, Christian* et al. 2016
13 Optical spectra of strained carbon nanotubes: The origin of strain-induced shifts Wagner, Christian* et al. 2016
14 Carbon nanotubes under strain: Electronic and Optical properties Wagner, Christian et al. 2015
15 Experimental and Theoretical Investigations on an in situ k-restore Process with Plasma Enhanced Fragmentation for Damaged ULK Materials Förster, Anja et al. 2015
16 Interaction between carbon nanotubes and metals: Electronic properties, stability, and sensing Fuchs, Florian et al. 2015
17 k-restore Process with Plasma Enhanced Fragmentation for Damaged ULK Materials — A DFT and MD Study Förster, Anja et al. 2015
18 Piezoresistance of Single Walled Carbon Nanotube in VHDL-AMS Kolchuzhin, Vladimir et al. 2015
19 Theoretical investigation of an in situ k-restore process for damaged ultra-low-k materials based on plasma enhanced fragmentation Förster, Anja* et al. 2015
20 Theoretical investigation of in situ k-restore processes for damaged ultra-low-k dielectrics Foerster, Anja et al. 2015
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