Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | Electrical Interface Characterization of Ultrathin Amorphous Silicon Layers on Crystalline Silicon | Thoma, Patrick* et al. | 2020 |
2 | Polycrystalline La1-xSrxMnO3 Films on Silicon: Influence of post-Deposition Annealing on Structural. (Magneto-)Optical, and (Magneto-)Electrical Properties | Thoma, Patrick* et al. | 2018 |
3 | Properties of Thin Layers of Electrically Conductive Polymer/MWCNT Composites Prepared by Spray Coating | Staudinger, U.* et al. | 2017 |
4 | The Effect of Layer Thickness on the Magnetic and Magneto-optical Properties of Sputtered and Annealed La1−xSrxMnO3 Thin Films on Silicon | Monecke, Manuel et al. | 2016 |
5 | I-V Characterisation of a-Si/c-Si Heterojunctions | Thoma, Patrick et al. | 2014 |
6 | Temperature Dependent Electrical Charge Carrier Mobility and Concentration Measurements of Sputter Silicon Films | Bülz, Daniel et al. | 2014 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 6 |