Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | About the Data Analysis of Optical Emission Spectra of Reactive Ion Etching Processes—The Method of Spectral Redundancy Reduction | Haase, Micha* et al. | 2024 |
2 | Real-Time End Point Detection via Automated Dynamic Mode Decomposition | Sayyed, Mudassir Ali* et al. | 2024 |
3 | Towards knowledge-enhanced process models for semiconductor fabrication | Rothe, Tom et al. | 2023 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 3 |