Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | Study of Nano-mechanical Properties for Thin Porous Films through Instrumented Indentation : SiO2 Low Dielectric Constant Films as an Example. | Herrmann, M. et al. | 2008 |
2 | Ring oscillator fabricated completely by means of mass-printing technologies | Hübler, Arved Carl et al. | 2007 |
3 | Structure of Nitrogenated Amorphous Carbon Films from NEXAFS | Bhattacharyya, S. et al. | 2002 |
4 | Nitridation of the GaAs(001) Surface by Atomic Nitrogen: a NEXAFS Investigation | Kampen, T. U. et al. | 2000 |
5 | Raman Spectroscopy Investigation of Cubic Boron Nitride Single Crystals and Layers on Si(100) | Werninghaus, T. et al. | 1997 |
6 | Raman Spectroscopy Investigation of Size Effects in Cubic Boron Nitride | Werninghaus, T. et al. | 1997 |
7 | Utilization of Cathodic Arc Evaporation for the Deposition of Boron Nitride Thin Films | Richter, F. et al. | 1997 |
8 | Cubic Boron Nitride Films by d.c. and r.f. Magnetron Sputtering: Layer Characterization and Process Diagnostics | Hahn, J. et al. | 1996 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 8 |