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Eintrag in der Universitätsbibliographie der TU Chemnitz

Volltext zugänglich unter
URN: urn:nbn:de:bsz:ch1-qucosa2-1041612


Yazdani, Saeid

Design of a Hybrid Digital-Analog Power Supply for Semiconductor Testing on Automated Test Equipment


Kurzfassung in englisch

Modern semiconductor testing requires power delivery systems that are not only precise, but also able to respond to rapidly changing conditions. Conventional power supply architectures in automated test equipment are increasingly pushed to their limits by the complex and dynamic behavior of modern devices, which can affect both the accuracy of applied stimuli and the reliability of measurements.
This work presents a hybrid digital?analog control approach to address these challenges. By combining the strengths of analog circuitry with the flexibility of digital control, the system can adapt its behavior during operation. In particular, time-variant control strategies are used to improve transient response, stability, and overall measurement consistency across different test conditions.
Experimental results show that this hybrid approach can mitigate several of the known limitations of traditional designs without adding unnecessary system complexity. The concept offers a practical path toward more robust and adaptable power delivery in automated test systems, supporting more reliable characterization and qualification of semiconductor devices.

Universität: Technische Universität Chemnitz
Institut: Professur Schaltkreis- und Systementwurf
Fakultät: Fakultät für Elektrotechnik und Informationstechnik
Dokumentart: Dissertation
Betreuer: Heinkel, Ulrich (Prof. Dr.-Ing.) ; Kuntzsch, Claus (Prof. Dr.-Ing.)
ISBN/ISSN: 978-3-96100-323-5 (print) ; 978-3-96100-324-2 (online)
DOI: doi:10.51382/978-3-96100-324-2
URL/URN: https://nbn-resolving.org/urn:nbn:de:bsz:ch1-qucosa2-1041612
Quelle: Chemnitz : Universitätsverlag Chemnitz ; Technische Universität Chemnitz, 2026. - 222 S.
SWD-Schlagwörter: Halbleiter , Regelungstechnik , Leistungselektronik , Messtechnik
Freie Schlagwörter (Englisch): Automated Test Equipment , Power Supply , Semiconductor Testing , Digital, Analog , System Control , Power Electronics , Measurement
DDC-Sachgruppe: Ingenieurwissenschaften, Angewandte Physik
Sprache: englisch
Tag der mündlichen Prüfung 06.08.2025
OA-Lizenz CC BY 4.0

 

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