Eintrag in der Universitätsbibliographie der TU Chemnitz
Meneghini, Matteo ;
Nicoletto, Marco ;
Piva, Francesco ;
Roccato, Nicola ;
Caria, Alessandro ;
Rampazzo, Fabiana ;
De Santi, Carlo ;
Buffolo, Matteo ;
Rossi, Francesca ;
Mura, Giovanna ;
Gasparotto, Andrea ;
Becht, Conny ;
Kusch, Gunnar ;
Ji, Yihong ;
Huang, Xuanqi ;
Fu, Houqiang ;
Chen, Hong ;
Zhao, Yuji ;
Trivellin, Nicola ;
Meneghesso, Gaudenzio ;
Zanoni, Enrico ;
Oliver, Rachel ;
Grandjean, Nicolas ;
Schwarz, Ulrich T.
Strassburg, Martin ; Kim, Jong Kyu ; Krames, Michael R.
Defects in InGaN QW structures: microscopic properties and modeling
Universität: | Technische Universität Chemnitz | |
Institut: | Professur Experimentelle Sensorik | |
Dokumentart: | Konferenzbeitrag, referiert | |
DOI: | doi:10.1117/12.3038351 | |
URL/URN: | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/13386/133860A/Defects-in-InGaN-QW-structures-microscopic-properties-and-modeling/10.1117/12.3038351.full | |
Quelle: | Light-Emitting Devices, Materials, and Applications XXIX, 25-31 JANUARY 2025, San Francisco, California, United States. - SPIE, 2025. - Proc. SPIE 13386, Light-Emitting Devices, Materials, and Applications XXIX, 133860A (19 March 2025) | |
Freie Schlagwörter (Englisch): | gallium nitride , light-emitting diode , defect , trap , dislocation , V-pit |