Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress | Meneghini, M. et al. | 2014 |
2 | Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence | Meneghini, M.* et al. | 2013 |
3 | Measurement of the internal quantum efficiency of InGaN quantum wells | Laubsch, A. et al. | 2007 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 3 |