Ergebnis der Datenbankabfrage
| Nr. | Titel | Autor | Jahr |
|---|---|---|---|
| 1 | Impact of the Level of Negative Gate Voltage on the Temperature Measurement during Power Cycling Testing of SiC MOSFETs | Heimler, Patrick* et al. | 2024 |
| 2 | Study of the Bias Driven Threshold Voltage Drift of 1.2 kV SiC MOSFETs in Power Cycling and High Temperature Gate Bias Tests | Boldyrjew-Mast, Roman* et al. | 2024 |
| 3 | Power Cycling of Discrete Devices with very high Power Density | Heimler, Patrick* et al. | 2023 |
| Anzahl der Ergebnisseiten: | 1 |
| Anzahl der Dokumente: | 3 |
