Ergebnis der Datenbankabfrage
| Nr. | Titel | Autor | Jahr |
|---|---|---|---|
| 1 | Modelling Creep Behaviour in Sintered Silver using User-Programmable Features in ANSYS | Forndran, Freerik* et al. | 2023 |
| 2 | Determination of Rate- and Temperature Dependent Inelastic Material Data for Sintered Silver Die Attach and Simulative Implementation | Forndran, Freerik* et al. | 2022 |
| 3 | Reliability and Lifetime Estimation of Sintered Silver Die Attach for Different Accelerated Testing Conditions | Forndran, Freerik et al. | 2022 |
| 4 | A Parametric Simulative Study for Lifetime Prediction of Sintered Silver Die Attach Under Different Accelerated Testing Conditions | Forndran, Freerik* et al. | 2021 |
| 5 | A Parametric Simulative Study for Si and SiC Semiconductor Devices Under Various Accelerated Testing Conditions Using Rate- and Temperature Dependent Inelastic Material Data | Forndran, Freerik* et al. | 2021 |
| Anzahl der Ergebnisseiten: | 1 |
| Anzahl der Dokumente: | 5 |
