Ergebnis der Datenbankabfrage
Nr. | Titel | Autor | Jahr |
---|---|---|---|
1 | Correction of Delay-Time-Induced Maximum Junction Temperature Offset during Electrothermal Characterization of IGBT Devices | Deng, Erping* et al. | 2020 |
2 | First results of development of a lifetime model for transfer molded discrete power devices | Zeng, Guang et al. | 2018 |
Anzahl der Ergebnisseiten: | 1 |
Anzahl der Dokumente: | 2 |