Ergebnis der Datenbankabfrage
| Nr. | Titel | Autor | Jahr |
|---|---|---|---|
| 1 | Untersuchungen zur Zuverlässigkeit von Dielektrika in Leistungsbauelementen | Beier-Möbius, Menia | 2021 |
| 2 | Breakdown of gate oxide of SiC-MOSFETs and Si-IGBTs under high temperature and high gate voltage | Beier-Möbius, Menia* et al. | 2017 |
| 3 | Breakdown of gate oxide of 1.2 kV SiC-MOSFETs under high temperature and high gate voltage | Beier-Möbius, Menia et al. | 2016 |
| 4 | High-Current Power Cycling Test-Bench for Short Load Pulse Duration and First Results | Zeng, Guang et al. | 2016 |
| 5 | Using the Zth(t) – power pulse measurement to detect a degradation in the module structure | Hiller, Sebastian et al. | 2015 |
| 6 | Improving the Accuracy of Junction Temperature Measurement with the Square-Root-t Method | Herold, Christian et al. | 2013 |
| 7 | Reliability of Discrete Power Semiconductor Packages and Systems – D2Pak and CanPAK in Comparison | Hofmann, Kay et al. | 2013 |
| Anzahl der Ergebnisseiten: | 1 |
| Anzahl der Dokumente: | 7 |
