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Nr. Titel Autor Jahr
1 Analysis of Aged Power Modules considering the Loss Calculation of a Heavy-Duty Fuel Cell Truck Gürlek, Yavuz* et al. 2025
2 Factors Influencing the Power Cycling Lifetime of Paralleled IGBT Chips Abuogo, James et al. 2025
3 Influence of Low Temperature Swings and Short Heating Times on the Power Cycling Capability of IGBTs in Discrete Housings Heimler, Patrick* et al. 2025
4 Influence of Switching Loss Magnitude on Lifetime During a Switch-Mode Power Cycling Test of SiC MOSFETs Abuogo, James* et al. 2025
5 Power Cycling Reliability of Paralleled IGBT Chips Heated with Conduction and Switching Losses Abuogo, James* et al. 2025
6 Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks Zhang, Yi* et al. 2025
7 Utilization of the IGBT On-Chip Temperature Sensor for Online Temperature Monitoring Considering Continuous Switching Operation Lakshmanan, Narender et al. 2025
8 Influence of Current Density on Power Cycling Test of Low Voltage MOSFETs in DC Body-Diode Mode and Switching MOSFET-Mode Abuogo, James* et al. 2024
9 Comparison of a Power Cycling Test using Repetitive Unclamped Inductive Switching for Heat Generation with the DC Power Cycling Test Abuogo, James* et al. 2023
10 Comparison of IGBT Junction Temperature Determination using an On-Chip Sensor and the VCE(T) Method Lakshmanan, Narender* et al. 2023
11 Switch-Mode Power Cycling Test of Silicon Carbide MOSFETs Using Repetitive Avalanche for Heat Generation Abuogo, James* et al. 2023
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