Eintrag in der Universitätsbibliographie der TU Chemnitz
Heimler, Patrick* ; Müller, Johannes ; Mysore, Madhu Lakshman ; Gesell, Sören ; Lutz, Josef ; Basler, Thomas
Influencing Factors on the Dynamic VSD Behaviour of Different SiC-MOSFET Technologies used for Temperature Read-Out via VSD(T)-Method during the Power Cycling Test at Different Operating Modes
| Universität: | Technische Universität Chemnitz | |
| Institut: | Professur Leistungselektronik | |
| Dokumentart: | Konferenzbeitrag, referiert | |
| ISBN/ISSN: | Print ISSN: 0026-2714 ; Online ISSN: 1872-941X | |
| DOI: | doi:10.1016/j.microrel.2026.116115 | |
| URL/URN: | https://www.sciencedirect.com/science/article/pii/S0026271426001198 | |
| Quelle: | Microelectronics Reliability. - 180. 2026, 116115. - 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | |
| Freie Schlagwörter (Englisch): | SiC MOSFET , Power Cycling , Body Diode , Accurate Temperature Measurement , Dynamic VSD Behaviour , Operation Modes | |
| OA-Lizenz | CC BY 4.0 |
