Universitätsbibliothek
Universitätsbibliographie

Universitätsbibliographie | Universitätsbibliothek | TU Chemnitz

Universitätsbibliothek

Ergebnis der Datenbankabfrage

Nr.	Titel	Autor	Jahr
1	Dynamic Characterization and Robustness of SiC MOSFETs Based on SmartSiCTM Engineered Substrates	Alaluss, Mohamed* et al.	2025
2	Influencing Factors on the Dynamic VSD Behaviour of different SiC-MOSFET Technologies used for Temperature Read-Out via VSD(T)-Method during the Power Cycling Test	Heimler, Patrick* et al.	2025
3	Investigation of Overcurrent Turn-Off Robustness of 1200 V SiC MOSFETs	Mysore, Madhu Lakshman* et al.	2025
4	Plasma Behavior of SiC MOSFETs with Engineered Substrates During Reverse Recovery	Alaluss, Mohamed et al.	2025
5	Surge Current Operation of Power GaN HEMTs with p-GaN Gate Under Positive Gate Voltage	Goller, Maximilian* et al.	2025
6	Understanding Snap-Off Phenomenon during Reverse Recovery in SiC MOSFET Body Diodes	Maitra, Abhishek* et al.	2025
7	Investigation of the IGBT’s and Diode’s Ruggedness Under Short-Circuit Type III Conditions Well Beyond the SOA	Mysore, Madhu Lakshman* et al.	2023
8	Study of Different Parameters Influencing the IGBT and Diode Robustness Under Short-Circuit Type III Conditions	Mysore, Madhu Lakshman* et al.	2023
9	Surge-Current capability of the different voltage class IGBTs	Mysore, Madhu Lakshman et al.	2023
10	Investigation of the Short Circuit Type II Safe Operating Area of IGBTs	Mysore, Madhu Lakshman et al.	2022
11	Aluminium modification as indicator for current filaments under repetitive short-circuit in 650 V IGBTs	Mysore, Madhu Lakshman et al.	2021
12	Study of 6.5 kV injection enhanced floating emitter (IEFE) IGBT switching behavior and its improved short-circuit robustness	Mysore, Madhu Lakshman et al.	2021
13	Current filament behavior in IGBTs of different voltage classes investigated by measurements and simulations	Bhojani, Riteshkumar et al.	2020
14	Al modification as indicator of current filaments in IGBTs under repetitive SC operation	Mysore, Madhu Lakshman et al.	2019
15	Investigation of repetitive short-circuit operation of 1200 V IGBTs in the IC-VCEphase space	Bhojani, Riteshkumar* et al.	2019

Aktuelle Seite:
Anzahl der Ergebnisseiten:	1
Anzahl der Dokumente:	15