Ergebnis der Datenbankabfrage
| Nr. | Titel | Autor | Jahr |
|---|---|---|---|
| 1 | On the Reverse Recovery of SiC MOSFET Inverse Diodes | Lutz, Josef* et al. | 2026 |
| 2 | Understanding Snap-Off Phenomenon during Reverse Recovery in SiC MOSFET Body Diodes | Maitra, Abhishek* et al. | 2025 |
| 3 | Understanding Inter-Chip Oscillations in Paralleled SiC MOSFETs | Maitra, Abhishek* et al. | 2024 |
| 4 | Study of Different Parameters Influencing the IGBT and Diode Robustness Under Short-Circuit Type III Conditions | Mysore, Madhu Lakshman* et al. | 2023 |
| 5 | Investigation of the Short Circuit Type II Safe Operating Area of IGBTs | Mysore, Madhu Lakshman et al. | 2022 |
| Anzahl der Ergebnisseiten: | 1 |
| Anzahl der Dokumente: | 5 |
