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Nr. Titel Autor Jahr
1 Advanced power cycling test strategies on discrete SiC MOSFETs in different operating modes and the impact on lifetime Hein, Lukas* et al. 2025
2 Analysis of Aged Power Modules considering the Loss Calculation of a Heavy-Duty Fuel Cell Truck Gürlek, Yavuz* et al. 2025
3 Analysis of Aged SiC MOSFET and Si IGBT Power Modules considering the Loss Calculation of a Heavy-Duty Fuel Cell Truck Gürlek, Yavuz* et al. 2025
4 Dynamic Characterization and Robustness of SiC MOSFETs Based on SmartSiCTM Engineered Substrates Alaluss, Mohamed* et al. 2025
5 Influence of Low Temperature Swings and Short Heating Times on the Power Cycling Capability of IGBTs in Discrete Housings Heimler, Patrick* et al. 2025
6 Influencing Factors on the Dynamic VSD Behaviour of different SiC-MOSFET Technologies used for Temperature Read-Out via VSD(T)-Method during the Power Cycling Test Heimler, Patrick* et al. 2025
7 Physics-Based Reliability Analysis of Power Modules at Substrate and Component Level Mathew, Anu et al. 2025
8 Power Cycling Testing for Power Semiconductor Switches: Methods, Standards, Limitations, and Outlooks Zhang, Yi* et al. 2025
9 Reliability of discrete SiC MOSFETs under severe temperature-shock and power cycling tests Heimler, Patrick* et al. 2025
10 Reliability Testing of SiC MOSFETs in Different Power Cycling Operating Modes - Focusing on the Challenges of Body Diode Testing Hein, Lukas* et al. 2025
11 Threshold voltage hysteresis investigation of SiC MOSFETs with different structures under various measurement conditions Xie, Dong* et al. 2025
12 Active Short-Circuit Investigation of SiC MOSFETs Alaluss, Mohamed* et al. 2024
13 Digital Twin-Based Lifetime Estimation of SiC Power Modules Mathew, Anu* et al. 2024
14 Impact of the Level of Negative Gate Voltage on the Temperature Measurement during Power Cycling Testing of SiC MOSFETs Heimler, Patrick* et al. 2024
15 Influence of the Gate Voltage during On-Time on the Power Cycling Capability of SiC MOSFETs Heimler, Patrick* et al. 2024
16 Influence of Transfer Molding on the Reliability of DCM SiC Power Modules Rudzki, Jacek* et al. 2024
17 Study of the Bias Driven Threshold Voltage Drift of 1.2 kV SiC MOSFETs in Power Cycling and High Temperature Gate Bias Tests Boldyrjew-Mast, Roman* et al. 2024
18 Influence of thermal interface material using discrete Si-IGBTs and consideration of power cycling conditions Heimler, Patrick* et al. 2023
19 Online Threshold Voltage Monitoring at SiC Power Devices during Power Cycling Test and Possible Consequences Heimler, Patrick* et al. 2023
20 Power Cycling of Discrete Devices with very high Power Density Heimler, Patrick* et al. 2023
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